Abstract: Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment.
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Introduction
Standard Test Interface Language (STIL) was initially developed by an ad-hoc consortium of test equipment vendors, computer-aided engineering (CAE) and computer-aided design (CAD) vendors, and integrated circuit (IC) manufacturers, to address the lack of a common solution for transferring digital test data from the generation environment to the test equipment.
The need for a common interchange format for large volumes of digital test data was identified as an overriding priority for the work; as such, the scope of the work was constrained to those aspects of the test environment that contribute significantly to the volume issue, or are necessary to support the comprehension of that data.
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1. Overview
Standard Test Interface Language (STIL) is a standard language that provides an interface between digital test generation tools and test equipment
STIL is a representation of information needed to define digital test operations in manufacturing tests. the overall STIL language is inherently more flexible than any particular tester.
Figure 2 shows how STIL fits into the data flow between computer-aided engineering (CAE)/simulation and the test environment.
Another issue presented in Figure 2 is the need for data from the tester to be transmitted back to the CAE/simulation environment for the purpose of correlating simulation data to tester data.
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