Abstract
The performance of high-speed serial data links, along
with the architectures of the transmitter and receiver
circuitry used on either end, has led to increasing difficulty
in applying traditional test and measurement techniques to
characterize these channels.
Thursday, September 30, 2010
Monday, September 27, 2010
Friday, September 17, 2010
Wednesday, September 8, 2010
Thursday, September 2, 2010
std 1450.6 CTL
(page 4)
Abstract: The Core Test Language (CTL) is a language created for a System-on-Chip flow (or
SoC flow), where a design created by one group is reused as a sub-design of a design created by
another group.
(page 6)
Introduction
CTL started as a language in the IEEE Std 1500TM-2005 standardization activity for core test.
(page 11)
1. Overview
1.1 General
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group.
CTL is a language designed to be the transfer mechanism of test knowledge between a core provider and a system integrator to allow for interoperability between the producer and the consumer of the information. It facilitates the reuse of test patterns provided for a core for application from the SoC boundary.
CTL provides the language for communication of test information.
(page 12)
Abstract: The Core Test Language (CTL) is a language created for a System-on-Chip flow (or
SoC flow), where a design created by one group is reused as a sub-design of a design created by
another group.
(page 6)
Introduction
CTL started as a language in the IEEE Std 1500TM-2005 standardization activity for core test.
(page 11)
1. Overview
1.1 General
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group.
CTL is a language designed to be the transfer mechanism of test knowledge between a core provider and a system integrator to allow for interoperability between the producer and the consumer of the information. It facilitates the reuse of test patterns provided for a core for application from the SoC boundary.
CTL provides the language for communication of test information.
(page 12)
Tuesday, August 31, 2010
std1450 STIL std
Abstract: Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment.
(page 3)
Introduction
Standard Test Interface Language (STIL) was initially developed by an ad-hoc consortium of test equipment vendors, computer-aided engineering (CAE) and computer-aided design (CAD) vendors, and integrated circuit (IC) manufacturers, to address the lack of a common solution for transferring digital test data from the generation environment to the test equipment.
The need for a common interchange format for large volumes of digital test data was identified as an overriding priority for the work; as such, the scope of the work was constrained to those aspects of the test environment that contribute significantly to the volume issue, or are necessary to support the comprehension of that data.
(page 9)
1. Overview
Standard Test Interface Language (STIL) is a standard language that provides an interface between digital test generation tools and test equipment
STIL is a representation of information needed to define digital test operations in manufacturing tests. the overall STIL language is inherently more flexible than any particular tester.
Figure 2 shows how STIL fits into the data flow between computer-aided engineering (CAE)/simulation and the test environment.
Another issue presented in Figure 2 is the need for data from the tester to be transmitted back to the CAE/simulation environment for the purpose of correlating simulation data to tester data.
(page 3)
Introduction
Standard Test Interface Language (STIL) was initially developed by an ad-hoc consortium of test equipment vendors, computer-aided engineering (CAE) and computer-aided design (CAD) vendors, and integrated circuit (IC) manufacturers, to address the lack of a common solution for transferring digital test data from the generation environment to the test equipment.
The need for a common interchange format for large volumes of digital test data was identified as an overriding priority for the work; as such, the scope of the work was constrained to those aspects of the test environment that contribute significantly to the volume issue, or are necessary to support the comprehension of that data.
(page 9)
1. Overview
Standard Test Interface Language (STIL) is a standard language that provides an interface between digital test generation tools and test equipment
STIL is a representation of information needed to define digital test operations in manufacturing tests. the overall STIL language is inherently more flexible than any particular tester.
Figure 2 shows how STIL fits into the data flow between computer-aided engineering (CAE)/simulation and the test environment.
Another issue presented in Figure 2 is the need for data from the tester to be transmitted back to the CAE/simulation environment for the purpose of correlating simulation data to tester data.
Monday, August 30, 2010
1149.7 std
(page ii)
Abstract: This specification describes circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1TM-2001.
(page 6)
introduction
This standard defines a debug and Test Access Port that provides both compatibility with IEEE Std
1149.1TM-2001a and operation with as few as two pins.
The process of developing this standard began in 2004 when the Mobile Industry Processor Interface (MIPI) Alliance Test and Debug Working Group was formed. During 2004, a standard that addressed the needs of both test and debug was described and requirements were gathered.
Once the requirements gathering process was completed in 2004, the Test and Debug Working Group turned its attention to proposals for addressing the above requirements
(page 53)
1. Overview
1.1 Scope
The standard will define a link between IEEE 1149.1 interfaces in Debug and Test Systems (DTS) and IEEE 1149.1 (JTAG) interfaces in Target Systems (TS).
1.2 Purpose
1.3 Contrasting IEEE Std 1149.1-2001 and this standard
(page 54)
IEEE Std 1149.1-2001 was introduced to address issues related to the manufacturing test of boards and systems.
This standard is complementary to IEEE Std 1149.1-2001 and does not seek to replace it.
This standard differs from IEEE Std 1149.1-2001 as it intentionally blurs the boundary between boards, packages, and chips.
Abstract: This specification describes circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1TM-2001.
(page 6)
introduction
This standard defines a debug and Test Access Port that provides both compatibility with IEEE Std
1149.1TM-2001a and operation with as few as two pins.
The process of developing this standard began in 2004 when the Mobile Industry Processor Interface (MIPI) Alliance Test and Debug Working Group was formed. During 2004, a standard that addressed the needs of both test and debug was described and requirements were gathered.
Once the requirements gathering process was completed in 2004, the Test and Debug Working Group turned its attention to proposals for addressing the above requirements
(page 53)
1. Overview
1.1 Scope
The standard will define a link between IEEE 1149.1 interfaces in Debug and Test Systems (DTS) and IEEE 1149.1 (JTAG) interfaces in Target Systems (TS).
1.2 Purpose
1.3 Contrasting IEEE Std 1149.1-2001 and this standard
(page 54)
IEEE Std 1149.1-2001 was introduced to address issues related to the manufacturing test of boards and systems.
This standard is complementary to IEEE Std 1149.1-2001 and does not seek to replace it.
This standard differs from IEEE Std 1149.1-2001 as it intentionally blurs the boundary between boards, packages, and chips.
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