ITC06_IJTAG_agilent A Case Study of Using IEEE P1687 (IJTAG) for High-Speed Serial I/O Characterization and Testing

Abstract
The performance of high-speed serial data links, along
with the architectures of the transmitter and receiver
circuitry used on either end, has led to increasing difficulty
in applying traditional test and measurement techniques to
characterize these channels.

Corelis study

http://www.corelis.com/

-Product
--scan express TPG

s man t1500 073109

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p10

S manual bsd 121609

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std 1450.6 CTL

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Abstract: The Core Test Language (CTL) is a language created for a System-on-Chip flow (or
SoC flow), where a design created by one group is reused as a sub-design of a design created by
another group.

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Introduction

CTL started as a language in the IEEE Std 1500TM-2005 standardization activity for core test.

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1. Overview
1.1 General
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group.

CTL is a language designed to be the transfer mechanism of test knowledge between a core provider and a system integrator to allow for interoperability between the producer and the consumer of the information. It facilitates the reuse of test patterns provided for a core for application from the SoC boundary.

CTL provides the language for communication of test information.
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